Reducing Switching Variability in PCM Device
Objective: Correlating writing schemes and crystallization process.
Feature: Combined modeling and experimental TEM analysis of actual devices.
This study combines simulation and TEM analysis of actual devices to establish correlations between writing schemes and the crystallization process. The goal is to identify dominant crystallization process and vary the write process for reducing variability of the resistance state.
Reduction of Partial SET Variability in PCM Devices
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