Carnegie Mellon University

Data Storage Systems Center

College of Engineering

Edge Roughness in Optical Waveguide

Objective: Understand the impact of edge roughness in WG
Feature: Fabrication SiN/AlNwaveguide w/ developed etching process

HAMR Dielectric Materials & Waveguides04_Edge_Roughness_in_Optical_Waveguide.png

 

For Sponsors

Related Materials

Project Overview Slides

 

Request your Sponsor Account.
Having trouble accessing content? Contact Chloë Mattingly for assistance.