A wide variety of x-ray diffraction measurements are obtained from three Rigaku x-ray generators. The accessories available with these machines enable pole figure texture analysis, thin film analysis, high and low temperature studies, stress measurements, and x-ray topography. A Philips high resolution diffractometer produces fine rocking curves and reciprocal space maps for epitaxial films and single crystals. Two Siemens x-ray generators provide Laue photography and Seeman-Bohlin geometry. Enhancing the above equipment is a powerful array of crystallographic software.
Fluorescence, fluoroscopy, and radiography facilities are also available.