The Materials Science and Engineering department maintains a state-of-the-art facility in electron microscopy, that is operated for the benefit of the university community at large. This facility houses three transmission electron microscopes (TEM), a scanning transmission electron microscope (STEM), two scanning electron microscopes (SEM) and extensive specimen preparation tools. The facility provides equipment and services to faculty, staff and graduate students engaged in a wide variety of research program.
Two SEM's are available: a Cam Scan Series IV SEM and a JOEL 35U SEM, both with PGT 4 plus energy dispersive X-ray analyzer. The SEM's can be used at accelerating voltages between 2 and 40 kV, with a point resolution of 5 nm. The energy dispersive X-ray analyzers can quantify elemental concentrations down to atomic number 11 (sodium).
Two 120kV TEM's are available: a JEOL-120CX TEMSCAN scanning transmission electron microscope (STEM) and a Philips EM 420 STEM, both with PGT System 4 Plus energy dispersive X-ray analyzer. The Philips STEM is furthermore equipped with a Gatan Parallel Electron Energy Loss Spectrometer (PEELS) for detection of light elements and electronic states of thin films. A VG model HB501, with 0.2nm resolution, is available for spin-polarized analysis (SEMPA).
A JEOL 4000EX high resolution transmission electron microscope (HRTEM), operating a 400 kV, is available for detailed observations at the atomic lengthscale. The microscope can be equipped with either a top-entry double-tilt high resolution stage, offering a point resolution of 0.168nm, or with a high resolution heating stage, offering 0.18nm resolution at temperatures up to about 800¼C. Image simulations are performed on a DEC ALPHA workstation cluster, with dedicated software packages for image analysis and processing, and connections with the campus-wide and national computer networks.
The dedicated specimen preparation tools include ultrasonic and mechanical cutting tools, Gatan precision dimplers and three Gatan DuoMills, for hot and cold ion beam thinning of thin sections.