2013 West Coast Technical Review
January 10
Carnegie Mellon Silicon Valley
In order to provide timely information to our sponsor companies on the West Coast and nearby areas, the DSSC will host a one-day review at the Carnegie Mellon Silicon Valley campus in Moffett Field, Calif., on January 8. The review will incorporate much of the information presented at our DSSC Fall Technical Review in Pittsburgh, with a few added highlights. By coming to the Bay Area, we hope to make our work more accessible to engineers and researchers within our sponsor companies who may not be able to attend our reviews in Pittsburgh.
Register
Online registration is now available.
Agenda
| Time | Activity |
|---|---|
| Breakfast | |
| 8:00–9:15 |
Breakfast |
| Opening Remarks | |
| 9:15–9:30 |
DSSC Overview |
| Session I: Heads (HAMR and PMR) | |
| 9:30–9:50 |
Materials for Improved NFT Optical and Thermal Performance |
| 9:50–10:10 |
High Thermal Conductivity AlN for NFT Heat Sinking |
| 10:10–10:30 |
NFT Designs for Using Active Devices |
| 10:30–11:00 |
Break |
| 11:00–11:30 |
The Effect of Roughness on Plasmonic Waveguide Losses |
| 11:30–12:00 |
Understanding Side-reading Effect in the Trilayer Reader Design |
| Lunch Break | |
| 12:00–1:30 |
Lunch and Posters |
| Session II: Media (HAMR and PMR) | |
| 1:30–1:50 |
Toward True Columnar Growth for Full Grain Isolation in HAMR Media |
| 1:50–2:10 |
Understanding Signal to Noise in Heat Assisted Magnetic Recording |
| 2:10–2:30 |
Pulsed Kerr Magnetomtery for HAMR Media Metrology |
| 2:30–3:00 |
Templated Co-Core Media for PMR |
| Afternoon Break | |
| 3:00–3:30 |
Break |
| SSD and Memory Technology | |
| 3:30–3:50 |
SSD and Non-Volatile Memory Error Pattern Analysis |
| 3:50–4:10 |
Coding for FLASH in Presence of Defects |
| 4:10–4:30 |
Temperature Excursions in Oxide Memory Cells During Electroforming |
Questions?
Any questions about the Review can be directed to Patricia Grieco, DSSC Administrative Manager.
Affiliates
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